Metrology Engineer

Semiconductor Mid-level (L4 equivalent) 2-5 years

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The job description

Tech stack. CD-SEM, scatterometry, overlay metrology, film thickness (ellipsometry), AFM, gauge R&R, measurement recipe development, data validation

About the role

A wafer fab needs a metrology engineer to own measurement accuracy for critical dimensions, overlay, and film properties, the numbers every process decision in the fab depends on. You will develop measurement recipes, qualify new metrology tools, match tools across the fleet, and build the data validation that keeps bad measurements from triggering bad actions. Bad measurements cause bad decisions, and you are the engineer who prevents that, which makes your work invisible when it succeeds and critical when it does not.

What you will achieve

Deliver measurement recipes with gauge R&R below 10 percent so process control decisions rest on solid data, with studies repeated after any tool or recipe change.
Drive metrology tool matching so measurements agree within tolerance across all tools of the same type, eliminating tool-to-tool offsets that masquerade as process shifts, with matching data reviewed monthly and corrective action on any drift.
Reduce measurement cycle time by 20 percent through sampling optimization, removing redundant sites and layers without losing process coverage, validated by comparing control performance before and after.
Own new-tool qualifications, bringing metrology capacity online within 4 weeks of tool install with documented accuracy, precision, throughput, and a complete measurement recipe library.
Cut misprocessing events caused by bad measurements to near zero through automated data validation checks that flag suspect results before engineers act on them, with out-of-family detection on every critical measurement.

What you will bring

Must-haves

BS or MS in physics, electrical engineering, materials science, or optics with strong measurement fundamentals.
2 to 5 years in semiconductor metrology or a closely related measurement role with tool ownership.
Hands-on experience with CD-SEM, scatterometry, or overlay metrology tools, including recipe development and troubleshooting.
Understanding of measurement uncertainty, gauge R&R methodology, and tool matching methods applied to production data.
Experience developing and optimizing measurement recipes for accuracy, precision, and throughput trade-offs.
Programming or scripting skills in Python or MATLAB for data analysis automation and dashboard building.

Nice-to-haves

Experience with e-beam or X-ray metrology techniques for advanced applications.
Knowledge of machine learning for measurement optimization or defect classification.
Familiarity with hybrid metrology approaches that combine multiple measurement techniques.